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Analysis of morphology of porous silicon layers using Flicker noise spectroscopy

✍ Scribed by Parkhutik, V. ;Collins, B. ;Sailor, M. ;Vstovsky, G. ;Timashev, S.

Publisher: John Wiley and Sons
Year: 2003
Tongue: English
Weight: 284 KB
Volume: 197
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.200306473

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