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Analysis of electrical and optical properties of silicon nanoclusters using flicker-noise spectroscopy

✍ Scribed by V. Parkhutik; J. M. Martínez Duart

Publisher: John Wiley and Sons
Year: 2001
Tongue: English
Weight: 99 KB
Volume: 15
Category: Article
ISSN: 0268-2605
DOI: 10.1002/aoc.152

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