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Study of the Optical and Structural Properties of Silicon–Carbon Nanometric Powder Using Infrared Phase Modulated Ellipsometry and Electron Microscopy

✍ Scribed by Garcia-Caurel, E. ;Viera, G. ;Bertran, E. ;Canillas, A.


Publisher
John Wiley and Sons
Year
1999
Tongue
English
Weight
278 KB
Volume
175
Category
Article
ISSN
0031-8965

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