✦ LIBER ✦
Morphology of Porous Silicon Layers Deduced from Polarization Memory Experiments
✍ Scribed by J. Diener; D. Kovalev; G. Polisski; N. Künzner; F. Koch
- Publisher
- John Wiley and Sons
- Year
- 2001
- Tongue
- English
- Weight
- 90 KB
- Volume
- 224
- Category
- Article
- ISSN
- 0370-1972
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✦ Synopsis
The morphology of porous silicon layers has been investigated by polarization resolved photoluminescence measurements in different geometrical arrangements. A uniaxial alignment of the long ellipsoidal axis of the aspheric Si nanocrystallites (NCs) parallel to the [100] growth direction is found. This overall orientation of the NCs is randomized with decreasing size of the NCs.