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Modelling the effects of piezoelectrically active defects and their impact on the threshold voltage of GaAs metal-semiconductor field effect transistors

โœ Scribed by A. Baric; Patrick J. McNally; J.Kilian McCaffrey


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
368 KB
Volume
28
Category
Article
ISSN
0921-5107

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