✦ LIBER ✦
Analysis of planar channeling effects on the threshold voltage uniformity of GaAs metal-semiconductor field-effect transistors using stereographic projection : H MIKAMI, N UCHITOMI, N TOYODA (VLSI Res. Center, Toshiba Corp., Kawasaki, Japan) J. Appl. Phys. (USA), vol. 64, no. 2, pp. 610–613 (15 July 1988)
- Publisher
- Elsevier Science
- Year
- 1989
- Tongue
- English
- Weight
- 103 KB
- Volume
- 20
- Category
- Article
- ISSN
- 0026-2692
No coin nor oath required. For personal study only.