๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Modelling and simulation for dielectric constant of aerogel

โœ Scribed by Xia Xiao; Reinhard Streiter; Gang Ruan; Renru Song; Thomas Otto; Thomas Gessner


Book ID
108411097
Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
433 KB
Volume
54
Category
Article
ISSN
0167-9317

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Simulation of the dielectric constant of
โœ X. Xiao; R. Streiter; H. Wolf; G. Ruan; C. Murray; T. Gessner ๐Ÿ“‚ Article ๐Ÿ“… 2001 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 83 KB

Nanoporous silica aerogels are promising candidates for ultra-low-k dielectrics used in the metallization system of the 0.13 mm IC generation and beyond. In this paper the relation between dielectric constant and microstructure is investigated. Application of an electrostatic field solver to several

Evaluation of SiO2 aerogel thin film wit
โœ Moon-Ho Jo; Jung-Kyun Hong; Hyung-Ho Park; Joong-Jung Kim; Sang-Hun Hyun ๐Ÿ“‚ Article ๐Ÿ“… 1997 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 316 KB

The material and dielectric properties of SiO 2 aerogel thin films were studied. These films were fabricated by spin coating and a subsequent supercritical drying method. Film porosity was evaluated as 67% with Rutherford backscattering spectrometry and its dielectric constant was measured to be 2.1