✦ LIBER ✦

Modeling of oxide-charge generation during hot-carrier degradation of PMOSFET's

✍ Scribed by Woltjer, R.; Paulzen, G.M.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Effects of high field injection on the h

✍ Zhang, J.F.; Eccleston, W. 📂 Article 📅 1995 🏛 IEEE 🌐 English ⚖ 810 KB

Channel-implant dose dependence of hot-c

✍ Kawabuchi, K.; Yoshimi, M.; Wada, T.; Takahashi, M.; Numata, K. 📂 Article 📅 1985 🏛 IEEE 🌐 English ⚖ 301 KB

On the different time dependence of inte

✍ R. Bellens; G. Groeseneken; P. Heremans; H.E. Maes 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 224 KB

Comprehensive physical modeling of nmosf

✍ M.M. Lunenborg; H.C. De Graaff; A.J. Mouthaan; J.F. Verweij Mesa 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 260 KB

Characterization of hot carrier degradat

✍ R. Mahnkopf; G. Przyrembel; H. G. Wagemann 📂 Article 📅 1991 🏛 Springer 🌐 English ⚖ 811 KB

Characterization of hot carrier degradat

✍ Beitrag R. Mahnkopf; G. Przyrembel; H. G. Wagemann 📂 Article 📅 1991 🏛 Springer 🌐 English ⚖ 16 KB