Channel-implant dose dependence of hot-carrier generation and injection in submicrometer buried-channel PMOSFET's

✍ Scribed by Kawabuchi, K.; Yoshimi, M.; Wada, T.; Takahashi, M.; Numata, K.

• Book ID: 114595252
• Publisher: IEEE
• Year: 1985
• Tongue: English
• Weight: 301 KB
• Volume: 32
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1985.22180