✦ LIBER ✦
Reduction of VT shift due to avalanche-hot-carrier injection using graded drain structures in submicron N-channel MOSFET: M. Noyori, Y. Nakata, S. Odanaka and J. Yasui. Proc. IEEE Reliab. Phys. Conf. 205 (1984)
- Publisher
- Elsevier Science
- Year
- 1985
- Tongue
- English
- Weight
- 133 KB
- Volume
- 25
- Category
- Article
- ISSN
- 0026-2714
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