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Modeling for stuck faults in cmos non-threshold logic (NTL) combinational circuits

โœ Scribed by Asad A. Ismaeel; Rakesh Bhatnagar


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
530 KB
Volume
35
Category
Article
ISSN
0026-2714

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โœ Leonard J. Tung; David V. Kerns ๐Ÿ“‚ Article ๐Ÿ“… 1988 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 581 KB

A new algorithm to generate test sets for stuck-at faults in combinational logic circuits via fault simulation is presented. The algorithm is non-path-sensitizing, non-pathtracing and can be easily implemented on a computer. The stuck-at fault model in the algorithm is developed using the component