๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Modeling and Characterization of Effects of Dummy-Gate Bias on LDMOSFETs

โœ Scribed by Marvin N. Marbell; Sergey V. Cherepko; James C. M. Hwang; M. Ayman Shibib; Walter R. Curtice


Book ID
114618628
Publisher
IEEE
Year
2007
Tongue
English
Weight
614 KB
Volume
54
Category
Article
ISSN
0018-9383

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES