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Modeling and characterization of atomically sharp “perfect” Ge/SiO2 interfaces

✍ Scribed by Wolfgang Windl; Tao Liang; Sergei Lopatin; Gerd Duscher

Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 349 KB
Volume: 114-115
Category: Article
ISSN: 0921-5107
DOI: 10.1016/j.mseb.2004.07.041

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