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Characterization and modeling of nanometric SiO2 dielectrics

✍ Scribed by C. Leroux; P. Mur; N. Rochat; D. Rouchon; R. Truche; G. Reimbold; G. Ghibaudo


Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
251 KB
Volume
72
Category
Article
ISSN
0167-9317

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