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Model of temperature dependent defect interaction and amorphization in crystalline silicon during ion irradiation

โœ Scribed by N. Hecking; K.F. Heidemann; E. Te Kaat


Book ID
113277805
Publisher
Elsevier Science
Year
1986
Tongue
English
Weight
404 KB
Volume
15
Category
Article
ISSN
0168-583X

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