✦ LIBER ✦
In-Situ HVEM study of dopant dependent {113}-defect generation in silicon during 1-MeV electron irradiation
✍ Scribed by Albert Romano-Rodriguez; Jan Vanhellemont
- Publisher
- John Wiley and Sons
- Year
- 1993
- Tongue
- English
- Weight
- 226 KB
- Volume
- 25
- Category
- Article
- ISSN
- 1059-910X
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