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Model of hot-carrier degradation for lateral IGBT device on SOI substrate

✍ Scribed by Huang, Tingting; Sun, Weifeng; Zhang, Chunwei; Qian, Qinsong; Liu, Siyang

Book ID: 121274946
Publisher: The Institution of Electrical Engineers
Year: 2013
Tongue: English
Weight: 281 KB
Volume: 49
Category: Article
ISSN: 0013-5194
DOI: 10.1049/el.2012.4036

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