✦ LIBER ✦
Novel Hot-Carrier Degradation Mechanisms in the Lateral Insulated-Gate Bipolar Transistor on SOI Substrate
✍ Scribed by Qinsong Qian; Weifeng Sun; Siyang Liu; Jing Zhu
- Book ID
- 114620374
- Publisher
- IEEE
- Year
- 2011
- Tongue
- English
- Weight
- 920 KB
- Volume
- 58
- Category
- Article
- ISSN
- 0018-9383
No coin nor oath required. For personal study only.