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Mobility degradation effects in CMOS differential pair transconductors

✍ Scribed by P. K. Chan; G. Wilson

Book ID: 104681396
Publisher: Springer
Year: 1992
Tongue: English
Weight: 346 KB
Volume: 2
Category: Article
ISSN: 0925-1030
DOI: 10.1007/bf00249250

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