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Dynamic effects in hot-carrier degradation relevant for CMOS operation

✍ Scribed by W. Weber; M. Brox

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Dynamic hot carrier degradation effects

✍ C. Bergonzoni; G.Dalla Libera; R. Benecchi; A. Nannini 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 359 KB