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Effects of Moisture on Radiation-Induced Degradation in CMOS SOI Transistors

✍ Scribed by Shaneyfelt, Marty R.; Schwank, James R.; Dodd, Paul E.; Hill, Tom A.; Dalton, Scott M.; Swanson, Scot


Book ID
111863185
Publisher
IEEE
Year
2010
Tongue
English
Weight
324 KB
Volume
57
Category
Article
ISSN
0018-9499

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