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Microwave and noise performance of SiGe BiCMOS HBT under cryogenic temperatures

โœ Scribed by Pruvost, S.; Delcourt, S.; Telliez, I.; Laurens, M.; Bourzgui, N.-E.; Danneville, F.; Monroy, A.; Dambrine, G.


Book ID
125435902
Publisher
IEEE
Year
2005
Tongue
English
Weight
240 KB
Volume
26
Category
Article
ISSN
0741-3106

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