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Temperature dependence and electrical properties of dominant low-frequency noise source in SiGe HBT

✍ Scribed by Bruce, S.; Vandamme, K.J.; Rydberg, A.

Book ID: 114538165
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 108 KB
Volume: 47
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.841247

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