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Microstructure and mechanical properties of Ti-Si-C-N films synthesized by plasma-enhanced chemical vapor deposition

โœ Scribed by Sudeep Abraham; Eun Young Choi; Namhyun Kang; Kwang Ho Kim


Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
867 KB
Volume
202
Category
Article
ISSN
0257-8972

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