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Microstructural study of dynamically annealed c-Si using MeV N+ ions

✍ Scribed by P.K. Sahoo; B. Satpati; P.V. Satyam; A. Pradhan; V.N. Kulkarni


Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
472 KB
Volume
256
Category
Article
ISSN
0168-583X

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