✦ LIBER ✦

Microstructural characterization of polycrystalline materials by synchrotron X-rays

✍ Scribed by Leyun Wang, Meimei Li, Jonathan Almer, Thomas Bieler…

Book ID: 120948208
Publisher: Springer-Verlag
Year: 2013
Tongue: English
Weight: 891 KB
Volume: 7
Category: Article
ISSN: 2095-025X
DOI: 10.1007/s11706-013-0201-0

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Synchrotron X-Rays for Microstructural I

Synchrotron X-Rays for Microstructural Investigations of Advanced Reactor Materials

✍ Wolfgang Hoffelner; Annick Froideval; Manuel Pouchon; Jiachao Chen; Maria Samara 📂 Article 📅 2007 🏛 The Minerals, Metals & Materials Society 🌐 English ⚖ 344 KB

X-ray scattering by real polycrystalline

X-ray scattering by real polycrystalline materials

✍ Dr. P. Klimanek 📂 Article 📅 1983 🏛 John Wiley and Sons 🌐 English ⚖ 179 KB

Composition characterization of combinat

Composition characterization of combinatorial materials by scanning X-ray fluorescence microscopy using microfocused synchrotron X-ray beam

✍ Stefan Vogt; Yong S. Chu; Andrei Tkachuk; Petr Ilinski; Donald A. Walko; Frank T 📂 Article 📅 2004 🏛 Elsevier Science 🌐 English ⚖ 308 KB

X-ray Diffraction by Polycrystalline Mat

X-ray Diffraction by Polycrystalline Materials (Guinebretière/X-ray) || Frontmatter

✍ Guinebretière, René 📂 Article 📅 2010 🏛 ISTE ⚖ 535 KB

Multi-scaled microstructures in natural

Multi-scaled microstructures in natural rubber characterized by synchrotron X-ray scattering and optical microscopy

✍ Shigeyuki Toki; Christian Burger; Benjamin S. Hsiao; Sureerut Amnuaypornsri; Jit 📂 Article 📅 2008 🏛 John Wiley and Sons 🌐 English ⚖ 416 KB

Use of synchrotron radiation for X-ray l

Use of synchrotron radiation for X-ray lithography and semiconductor materials characterization

✍ J. Matsui 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 719 KB