X-ray scattering by real polycrystalline materials

X-ray scattering by a superlattice

✍ M. Apostol 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 59 KB

X-ray scattering by a superlatice consisting of two types of alternating layers is considered, including both the statistical spread in the layer thicknesses and the phase slippage at inter-layer boundaries. The Bragg peak is not only smeared out, but it is also displaced by an amount proportional t

Real-time in situ light scattering and X

Real-time in situ light scattering and X-ray scattering studies of polyethylene blown film deformation

✍ Michael F. Butler; Athene M. Donald 📂 Article 📅 1998 🏛 John Wiley and Sons 🌐 English ⚖ 634 KB

A series of linear low-density polyethylene blown films were studied using the techniques of time-resolved, small-angle X-ray scattering (SAXS) using a synchrotron source and a time-resolved, small-angle light scattering. Scattering patterns and the load-extension curve were obtained simultaneously

Real structure of a partially crystallin

Real structure of a partially crystalline maltodextrin gel as revealed by wide-angle x-ray scattering

✍ Ch. Gernat; F. Reuther; G. Damaschun; F. Schierbaum 📂 Article 📅 1987 🏛 John Wiley and Sons 🌐 English ⚖ 468 KB

In maltodextrin gels the junction zones of the network are microcrystalline domains consisting of polysaccharide chains. Such microcrystalline aggregates already exist in a 10% maltodextrin solution. If the degree of crystallinity rises above loyo, a gel is formed. In the 25% gel, ISYO of the polysa

Thin Film Analysis by X-Ray Scattering (

Thin Film Analysis by X-Ray Scattering (BIRKHOLZ:THIN FILM X-RAY O-BK) || Principles of X-ray Diffraction

✍ Birkholz, Mario 📂 Article 📅 2006 🏛 Wiley-VCH Verlag GmbH & Co. KGaA 🌐 German ⚖ 678 KB

Diffraction effects are observed when electromagnetic radiation impinges on periodic structures with geometrical variations on the length scale of the wavelength of the radiation. The interatomic distances in crystals and molecules amount to 0.15-0.4 nm which correspond in the electromagnetic spectr

Thin Film Analysis by X-Ray Scattering (

Thin Film Analysis by X-Ray Scattering (BIRKHOLZ:THIN FILM X-RAY O-BK) || High-Resolution X-ray Diffraction

✍ Birkholz, Mario 📂 Article 📅 2006 🏛 Wiley-VCH Verlag GmbH & Co. KGaA 🌐 German ⚖ 766 KB

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of t

Thin Film Analysis by X-Ray Scattering (

Thin Film Analysis by X-Ray Scattering (BIRKHOLZ:THIN FILM X-RAY O-BK) || Index

✍ Birkholz, Mario 📂 Article 📅 2006 🏛 Wiley-VCH Verlag GmbH & Co. KGaA 🌐 German ⚖ 98 KB

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of t