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Composition characterization of combinatorial materials by scanning X-ray fluorescence microscopy using microfocused synchrotron X-ray beam

โœ Scribed by Stefan Vogt; Yong S. Chu; Andrei Tkachuk; Petr Ilinski; Donald A. Walko; Frank Tsui

Book ID
108418194
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
308 KB
Volume
223
Category
Article
ISSN
0169-4332

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