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Multi-scaled microstructures in natural rubber characterized by synchrotron X-ray scattering and optical microscopy

✍ Scribed by Shigeyuki Toki; Christian Burger; Benjamin S. Hsiao; Sureerut Amnuaypornsri; Jitladda Sakdapipanich; Yasuyuki Tanaka

Book ID: 105339023
Publisher: John Wiley and Sons
Year: 2008
Tongue: English
Weight: 416 KB
Volume: 46
Category: Article
ISSN: 0887-6266
DOI: 10.1002/polb.21578

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