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Microstrain in Al0.22Ga0.78N/GaN heterostructure studied by X-ray diffraction and scattering

✍ Scribed by W.S. Tan; H.L. Cai; X.S. Wu; S.S. Jiang; W.L. Zheng; Q.J. Jia

No coin nor oath required. For personal study only.

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