Strain-free Al0.08In0.018Ga0.902N/GaN heterostructure: Combined Rutherford backscattering/channeling and high resolution X-ray diffraction

✍ Scribed by Huan Wang; Tianxiang Chen; Shude Yao

• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 362 KB
• Volume: 266
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2008.02.069