Depth dependent elastic strain in ZnO epilayer: combined Rutherford backscattering/channeling and X-ray diffraction

✍ Scribed by Zhenxing Feng; Shude Yao; Lina Hou; Ruiqin Jin

• Publisher: Elsevier Science
• Year: 2005
• Tongue: English
• Weight: 159 KB
• Volume: 229
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2004.11.020