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Aluminium incorporation in AlxGa1 − xN/GaN heterostructures: A comparative study by ion beam analysis and X-ray diffraction

✍ Scribed by A. Redondo-Cubero; R. Gago; F. González-Posada; U. Kreissig; M.-A. di Forte Poisson; A.F. Braña; E. Muñoz

Book ID: 108290083
Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 680 KB
Volume: 516
Category: Article
ISSN: 0040-6090
DOI: 10.1016/j.tsf.2008.04.069

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Aluminium incorporation in AlxGa1 − xN/GaN heterostructures: A comparative study by ion beam analysis and X-ray diffraction