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Microscopic simulation of chaotic current fluctuations in a two-valley semiconductor

โœ Scribed by Ki-ichi Nakamura


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
410 KB
Volume
138
Category
Article
ISSN
0375-9601

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Two-level fluctuations (random telegraph noise) of transverse hopping current have been investigated in mesoscopic nanostructures fabricated on a submicrometer area of a thin amorphous silicon layer. An electric field and light-induced change of the system lifetimes in the high and low conductive st