Simulant study of magnetic-field-induced cross-over current instability and chaos in a high-purity semiconductor

✍ Scribed by K. Aoki

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 558 KB
• Volume: 152
• Category: Article
• ISSN: 0375-9601
• DOI: 10.1016/0375-9601(91)90560-u