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Microfaceting of 90° [100] tilt boundaries in YBa2Cu3O7−x thin films

✍ Scribed by A.F. Marshall; C.B. Eom

Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
617 KB
Volume
207
Category
Article
ISSN
0921-4534

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✦ Synopsis

Varlatmns in the structure and microfaceting of 90 ° [ 100] grain boundaries in YBa2CuaOT_x thin films have been studied by high-resolution electron microscopy The c-axis changes direction by 90 ° across such boundaries Boundaries with a nominally symmetric tilt orientation exhibit quite vaned structures on the nanoscale level, which may be relevant to the range of transport properties measured for such boundaries in thin films and step-edge junctions This tilt boundary orientation is favored by the film orientation and growth amsotropy of YBa2Cu3OT_x but does not appear to be energetically favored The boundaries are comprised of symmetric and basal-plane-faced tilt facets, and twist facets The latter, which have been previously characterized, may account for the non-weak-link behavior of the nominally symmetric boundanes in the [ 301 ] direction of ( 103 ) films a-Axis films, which are synthesized at lower temperatures, also exhibit a prevalence of lattice mismatched symmetrical boundaries

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