✦ LIBER ✦

Methods for characterization of packaging parasitics of semiconductor lasers

✍ Scribed by S. J. Zhang; N. H. Zhu; J. Liu; J. B. Zhang; L. Xie

Publisher: John Wiley and Sons
Year: 2005
Tongue: English
Weight: 99 KB
Volume: 47
Category: Article
ISSN: 0895-2477
DOI: 10.1002/mop.21115

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✦ Synopsis

Two novel methods for analyzing the parasitics of packaging networks are proposed based on the relations between the scattering parameters of a semiconductor laser before and after packaging, and the experiments are designed and performed using our methods. It is found that the analysis results of the two methods are in good agreement with the measurements. Either of the two methods can provide an alternative approach for characterizing the packaging parasitics for semiconductor lasers, and both are convenient due to the developed measurement techniques.

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