Two novel methods for analyzing the parasitics of packaging networks are proposed based on the relations between the scattering parameters of a semiconductor laser before and after packaging, and the experiments are designed and performed using our methods. It is found that the analysis results of t
โฆ LIBER โฆ
4734641 Method for the thermal characterization of semiconductor packaging systems
โ Scribed by Dee Byrd; Michael Williams
- Publisher
- Elsevier Science
- Year
- 1988
- Tongue
- English
- Weight
- 88 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0026-2714
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