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Use of EOS (electrolyte/oxide/semiconductor) systems for the electrical characterization of illuminated semiconductor/dielectric interfaces

✍ Scribed by J.L. Diot; J. Joseph; J.R. Martin; P. Chelchet


Publisher
Elsevier Science
Year
1986
Weight
276 KB
Volume
197
Category
Article
ISSN
0022-0728

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