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Metastability behavior of CMOS ASIC flip-flops in theory and test

✍ Scribed by Horstmann, J.U.; Eichel, H.W.; Coates, R.L.

Book ID: 119773665
Publisher: IEEE
Year: 1989
Tongue: English
Weight: 1011 KB
Volume: 24
Category: Article
ISSN: 0018-9200
DOI: 10.1109/4.16314

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