𝔖 Bobbio Scriptorium

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[IEEE 15th Annual IEEE International ASIC/SOC Conference - Rochester, NY, USA (25-28 Sept. 2002)] 15th Annual IEEE International ASIC/SOC Conference - Characterizing dynamic and leakage power behavior in flip-flops

✍ Scribed by Ramanarayanan, R.; Vijaykrishnan, N.; Irwin, M.J.

Book ID: 121694625
Publisher: IEEE
Year: 2002
Weight: 267 KB
Category: Article
ISBN-13: 9780780374942
DOI: 10.1109/asic.2002.1158098

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