Radiation hardness tests and characterization of the CLARO-CMOS, a low power and fast single-photon counting ASIC in 0.35micron CMOS technology

✍ Scribed by Fiorini, M.; Andreotti, M.; Baldini, W.; Calabrese, R.; Carniti, P.; Cassina, L.; Cotta Ramusino, A.; Giachero, A.; Gotti, C.; Luppi, E.; Maino, M.; Malaguti, R.; Pessina, G.; Tomassetti, L.

• Book ID: 122222621
• Publisher: Elsevier Science
• Year: 2014
• Tongue: English
• Weight: 978 KB
• Volume: 766
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/j.nima.2014.04.072