Comparison of heavy-ion induced SEU for D- and TMR-flip-flop designs in 65-nm bulk CMOS technology

✍ Scribed by YiBai He,ShuMing Chen

• Book ID: 126359959
• Publisher: Science in China Press (SCP)
• Year: 2014
• Tongue: English
• Weight: 428 KB
• Volume: 57
• Category: Article
• ISSN: 1674-733X
• DOI: 10.1007/s11432-014-5100-1