## Abstract The atomic force acoustic microscopy (AFAM) technique has been used to determine elastic properties of films with thicknesses decreasing from several hundreds of nanometers to several nanometers. It has been shown that metal films as thin as 50βnm can be characterized directly without t
β¦ LIBER β¦
Mechanical characterization of polymeric thin films by atomic force microscopy based techniques
β Scribed by Passeri, Daniele; Rossi, Marco; Tamburri, Emanuela; Terranova, Maria Letizia
- Book ID
- 119962435
- Publisher
- Springer
- Year
- 2012
- Tongue
- English
- Weight
- 941 KB
- Volume
- 405
- Category
- Article
- ISSN
- 1618-2650
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