Since its invention twenty years ago the atomic force microscope (AFM) has become one of the most important instruments in colloid and interface science. The ability of tracing force profiles between single particles or particles and flats in liquid environment makes it a tool-of-choice for investig
β¦ LIBER β¦
Direct force producing uniform ultra-thin chitosan films by atomic force microscopy
β Scribed by Zhao, Huiling; Zhang, Shuai; Li, Qiang; Li, Yinli; Liu, Bo; Besenbacher, Flemming; Dong, Mingdong
- Book ID
- 119948036
- Publisher
- The Royal Society of Chemistry
- Year
- 2012
- Tongue
- English
- Weight
- 571 KB
- Volume
- 2
- Category
- Article
- ISSN
- 2046-2069
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
Thin liquid films studied by atomic forc
β
Elmar Bonaccurso; Michael Kappl; Hans-JΓΌrgen Butt
π
Article
π
2008
π
Elsevier Science
π
English
β 727 KB
In situ thickness measurements of ultra-
β
Lobo, R F M; Pereira-da-Silva, M A; Raposo, M; Faria, R M; Oliveira, O N; Pereir
π
Article
π
1999
π
Institute of Physics
π
English
β 776 KB
Analysis of silver columnar thin films b
β
Benkabou, Fatima (author);Lakhtakia, Akhlesh (author)
π
Article
π
2008
π
SPIE
β 476 KB
Atomic Force Microscopy Imaging of Thin
β
Simon Biggs; Franz Grieser
π
Article
π
1994
π
Elsevier Science
π
English
β 414 KB
Mechanical Characterization of Thin Film
β
Malgorzata Kopycinska-MΓΌller; Andre Striegler; Bernd KΓΆhler; Klaus-JΓΌrgen Wolter
π
Article
π
2010
π
John Wiley and Sons
π
English
β 361 KB
π 2 views
## Abstract The atomic force acoustic microscopy (AFAM) technique has been used to determine elastic properties of films with thicknesses decreasing from several hundreds of nanometers to several nanometers. It has been shown that metal films as thin as 50βnm can be characterized directly without t
Indentation modulus and hardness of poly
β
D. Passeri; A. Alippi; A. Bettucci; M. Rossi; E. Tamburri; M.L. Terranova
π
Article
π
2011
π
Elsevier Science
π
English
β 194 KB