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Atomic Force Microscopy Characterization of ZnTe Epitaxial Thin Films

✍ Scribed by Klapetek, Petr; Ohlídal, Ivan; Montaigne-Ramil, Alberto; Bonanni, Alberta; Stifter, David; Sitter, Helmut

Book ID
125507997
Publisher
Institute of Pure and Applied Physics
Year
2003
Tongue
English
Weight
248 KB
Volume
42
Category
Article
ISSN
0021-4922

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