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Measuring the backscattering coefficient and secondary electron yield inside a scanning electron microscope

✍ Scribed by L. Reimer; C. Tollkamp

Book ID: 112188004
Publisher: Hindawi Limited
Year: 1980
Tongue: English
Weight: 419 KB
Volume: 3
Category: Article
ISSN: 0161-0457
DOI: 10.1002/sca.4950030105

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