A new type of scanning electron microscope using the coaxial backscattered electrons

✍ Scribed by C.Z Jiang; P Morin; N Rosenberg

• Publisher: Elsevier Science
• Year: 2002
• Tongue: English
• Weight: 394 KB
• Volume: 33
• Category: Article
• ISSN: 0968-4328
• DOI: 10.1016/s0968-4328(00)00062-7

✦ Synopsis

A new coaxial detection system for backscattered electrons in SEM is described. This coaxial detection system allows us to collect only the backscattered electrons that have lost a small percentage of the primary energy, emerging from the sample surface with a take-off angle defined by the objective lens. This new configuration reinforces the atomic-number contrast and suppresses effectively the topographic contrast. The simulation and experimental results confirm these expectations: this new type of SEM is very suitable for observing differences in atomic number. Moreover, by associating the obtained image with a conventional secondary electron image, we build a third (color) image that allows us to give finally at the same time, in a single image, both of the chemical and topographic information.