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Measuring the diameter of an electron probe with a scanning electron microscope

โœ Scribed by Yu. A. Novikov; A. V. Rakov; I. Yu. Stekolin


Publisher
Springer US
Year
1995
Tongue
English
Weight
228 KB
Volume
38
Category
Article
ISSN
0543-1972

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In nanoprobing measurements the quality of the electrical contact strongly depends on the contact force. Probing semiconductors such as silicon requires applying very high and stable forces to establish an ohmic contact between the probe tip and the structure under study. Therefore, a compact force