Four-probe resistance measurements of nickel wires written with a scanning tunneling microscope/scanning electron microscope system

✍ Scribed by E.E. Ehrichs; W.F. Smith; A.L. de Lozanne

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 491 KB
• Volume: 42-44
• Category: Article
• ISSN: 0304-3991
• DOI: 10.1016/0304-3991(92)90462-s